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RESEARCH PAPER · Journal of Applied Physics · 2024

Gallium oxide semiconductor-based large volume ultrafast radiation hard spectroscopic scintillators

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Gallium oxide semiconductor-based large volume ultrafast radiation hard spectroscopic scintillatorsOriginalTemperature-dependent broadening of spectral lineshapes and kinetics of luminescence centers in monoclinic gallium oxide nanowires3A Survey of Crystals for SPECT Imaging7Gallium oxide (Ga2O3) as a radiation detector distinguishing neutrons and gammas9Rare earth element applications in Ga2O3: Luminescence and scintillation13Realization of 4-inch diameter and thick β-Ga 2 O 3 single crystals using the vertical Bridgman method1Gamma Irradiation Effects on Surge Protective Components: A Comprehensive Experimental Evaluation of Transient and V–I Characteristics0

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  1. Temperature-dependent broadening of spectral lineshapes and kinetics of luminescence centers in monoclinic gallium oxide nanowires

    Journal of Alloys and Compounds · 2024-11-14

    Tasfia Chowdhury, Dholon Kumar Paul, Md. Rabiur Rahaman, Cuong Ton‐That, M. Azizar Rahman

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  2. A Survey of Crystals for SPECT Imaging

    Crystals · 2024-11-29

    Shuyu Xu, Zijun Yan, Qingyang Wei

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  3. Gallium oxide (Ga2O3) as a radiation detector distinguishing neutrons and gammas

    APL Materials · 2025-04-01

    D. J. Valdes, L. Rendón, J. Winkelbauer, P. Koehler, Sven C. Vogel, Ke-Xun Sun

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  4. Rare earth element applications in Ga2O3: Luminescence and scintillation

    Applied Physics Reviews · 2025-06-01

    Yibo Zhang, Zhuolun Han, Yizhang Guan, Yimin Liao, Jierui Xue, Guofeng Hu, Chee‐Keong Tan

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  5. Realization of 4-inch diameter and thick β-Ga 2 O 3 single crystals using the vertical Bridgman method

    CrystEngComm · 2026-01-01

    Dongyang Huang, Haotian Huang, Ziqian Xu, Yongqiang Jin, Ziming Wang, Bowen Jiang, Mingyan Pan, Ning Jia, Hongji Qi

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  6. Gamma Irradiation Effects on Surge Protective Components: A Comprehensive Experimental Evaluation of Transient and V–I Characteristics

    IEEE Transactions on Device and Materials Reliability · 2026-03-17

    Konstantinos M. Gektidis, I. Kaissas, Thomas E. Tsovilis

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