RESEARCH PAPER · Journal of Applied Physics · 2024
Gallium oxide semiconductor-based large volume ultrafast radiation hard spectroscopic scintillators
Read original paper ↗See where this research leads.
6 direct citing papers in this saved network. Explore the next layer with second-order citations.
Filter Citing Papers Filters active
All journals
No journals match your search.
Most represented first · select one or moreExplore Terms In These PapersHide SuggestionsShow Suggestions
No citing papers match these filters. Change a term or clear filters to see the network again.
Abstract From The Index
Arrows point to the paper being cited. Selecting a paper shows its incoming citations and its known path back to the original paper.
Browse Matching Papers
Papers that cite this work
6 direct citing papers saved.
Temperature-dependent broadening of spectral lineshapes and kinetics of luminescence centers in monoclinic gallium oxide nanowires
Journal of Alloys and Compounds · 2024-11-14
Tasfia Chowdhury, Dholon Kumar Paul, Md. Rabiur Rahaman, Cuong Ton‐That, M. Azizar Rahman
Read original paper ↗ ·A Survey of Crystals for SPECT Imaging
Crystals · 2024-11-29
Shuyu Xu, Zijun Yan, Qingyang Wei
Read original paper ↗ ·Gallium oxide (Ga2O3) as a radiation detector distinguishing neutrons and gammas
APL Materials · 2025-04-01
D. J. Valdes, L. Rendón, J. Winkelbauer, P. Koehler, Sven C. Vogel, Ke-Xun Sun
Read original paper ↗ ·Rare earth element applications in Ga2O3: Luminescence and scintillation
Applied Physics Reviews · 2025-06-01
Yibo Zhang, Zhuolun Han, Yizhang Guan, Yimin Liao, Jierui Xue, Guofeng Hu, Chee‐Keong Tan
Read original paper ↗ ·Realization of 4-inch diameter and thick β-Ga 2 O 3 single crystals using the vertical Bridgman method
CrystEngComm · 2026-01-01
Dongyang Huang, Haotian Huang, Ziqian Xu, Yongqiang Jin, Ziming Wang, Bowen Jiang, Mingyan Pan, Ning Jia, Hongji Qi
Read original paper ↗ ·Gamma Irradiation Effects on Surge Protective Components: A Comprehensive Experimental Evaluation of Transient and V–I Characteristics
IEEE Transactions on Device and Materials Reliability · 2026-03-17
Konstantinos M. Gektidis, I. Kaissas, Thomas E. Tsovilis
Read original paper ↗ ·