RESEARCH PAPER · Microscopy and Microanalysis · 2026
Probing Defects in the Cu Rich Cu1-xMn1+ySiTe3
S. Anil, Sai Venkata Gayathri Ayyagari, Yuxi Zhang, Soumi Mondal, Subrata Ghosh, Y. T. Liu, Chandan De, Boyang Zheng, Weiwei Xie, Vincent H. Crespi, Zhiqiang Q. Mao, Nasim Alem
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