RESEARCH PAPER · Small · 2026
Ultrawide Charge‐Trap Memory Window and Photoinduced Synaptic Behavior in p ‐Channel Amorphous Oxide Semiconductors
Seungho Bang, Deogkyu Choi, Hyeong Chan Suh, Chaewon Lee, Seoyoung Lim, Young Joo Yu, Dong Hyeon Kim, Sung Hyuk Kim, Jaekak Yoo, Taehoon Kim, Dohyeon Lee, Hyeon Jung Park, Un Jeong Kim, Dong‐Joon Yi, Hongseok Oh, Dongwook Kim, Mun Seok Jeong
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