RESEARCH ARTICLE · Journal of the American Chemical Society · 2026
Fast Interfacial Hole Consumption Suppresses Space–Charge Layer Trap Filling in BiVO 4 Photoanodes
Longren Li, Tong Wang, Beier Hu, Louise I. Oldham, Q. Z. Chen, K Li, Chuxi Yang, Paransa Alimard, Zhu Meng, Haoqing Ning, James Robert Durrant, Andreas Kafizas, Artem A. Bakulin
Read original paper ↗See where this research leads.
A citation map has not been saved for this paper yet.
The paper record is available below. Preparing a network uses the existing account and source-allowance controls.
Papers that cite this work
No saved citation network is available; this does not mean the paper has no citations.
