RESEARCH PAPER · Nano Letters · 2026
Electron Microscopy Measurement of Picometer-Level Distortion Induced Local Phonons at a Defect
Bo Han, Ruochen Shi, Huining Peng, Yingjie Lv, Q. C. Li, Ruishi Qi, Yuehui Li, Peiyi He, Xiaoyue Gao, Jiangbo Lu, J Zhang, Shulin Chen, Jinlong Du, Pu Yu, Peng Gao
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