RESEARCH PAPER · ACS Applied Electronic Materials · 2026
Dual-Functional Ni/4H-SiC Schottky Interfaces: Robust UV and X-ray Detection, Imaging in Extreme Environments
Chowdam Venkata Prasad, Sunjae Kim, B. J. Park, Hyeongju Cha, Seong-Jin Park, Hyeon-do Kang, Geon‐Hee Lee, Jin-Woo Choi, Byungdo Park, Geoffrey Tse, Nilesh Kumar Jaiswal, Dudekula Shaikshavali, Weon Ho Shin, Jeongho Kim, Jong-Min Oh, Wan Sik Hwang, Sang‐Mo Koo
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