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RESEARCH PAPER · RSC Advances · 2026

Embedding-driven physics informed neural network for predicting optical constants across materials

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Embedding-driven physics informed neural network for predicting optical constants across materialsOriginalHigh-Throughput full-spectrum characterization of semiconductor thin films via AD-accelerated physics-informed inversion: Demonstrations in Si and SiC epitaxy0

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  1. High-Throughput full-spectrum characterization of semiconductor thin films via AD-accelerated physics-informed inversion: Demonstrations in Si and SiC epitaxy

    Journal of Alloys and Compounds · 2026-08-28

    Zhentao Li, Xiang Zhong, Zhong Jing, Xinge Liu

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