RESEARCH PAPER · Materials Today Electronics · 2025
Artificial intelligence for post-moore field-effect transistors: a review and perspective
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The shift to data-driven microelectronics: machine learning for MOSFET modeling, design, and reliability
Journal of Computational Electronics · 2026-05-09
Qianhao Zhang, Junjie Guo, Chaoqun Jiang, Jingyu Yao, Zhikuo Tao
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