RESEARCH PAPER · ACS Applied Materials & Interfaces · 2025
Electrical Performance and Deep-Level Trap Characterization of p-CuGaO2/β-Ga2O3 Heterojunctions for Power Electronics
Chowdam Venkata Prasad, Geon‐Hee Lee, Jang Hyeok Park, Dudekula Shaikshavali, Kyong Jae Kim, Ho Jung Jeon, Nilesh Kumar Jaiswal, Myeong Geun Yu, Madani Labed, Sang‐Mo Koo, You Seung Rim
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