RESEARCH PAPER · Advanced Electronic Materials · 2025
Assessment of Trapping Phenomena in As‐Grown and Thermally‐Treated Si‐Doped κ‐Ga2O3 Layers via Optical Admittance Spectroscopy
Payam Rajabi Kalvani, A. Parisini, Maura Pavesi, Francesco Mattei, Piero Mazzolini, Kingsley O. Egbo, Oliver Bierwagen, Abderrahim Moumen, Salvatore Vantaggio, Samaneh Shapouri, Matteo Bosi, L. Seravalli, R. Fornari
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