RESEARCH PAPER · Nano Letters · 2024
Single-Image-Based Deep Learning for Precise Atomic Defect Identification
Kangshu Li, Xiaocang Han, Yuan Meng, Junxian Li, Yanhui Hong, Xiang Chen, Jing‐Yang You, Yao Lin, Wenchao Hu, Zhiyi Xia, Guolin Ke, Linfeng Zhang, Jin Zhang, Xiaoxu Zhao
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