RESEARCH PAPER · VNU Journal of Science Mathematics - Physics · 2022
DFT based Investigation of Structural, Thermodynamic, Mechanical and Electronic Properties of RuVZ (Z: As, Bi, Sb) Half-Heusler Semiconductors
Read original paper ↗See where this research leads.
A citation map has not been saved for this paper yet.
Open in your workspace →Open your workspace to prepare the citation network.
The paper record is available below. Preparing a network uses the existing account and source-allowance controls.
Papers that cite this work
No saved citation network is available; this does not mean the paper has no citations.