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RESEARCH PAPER · Ferroelectrics · 2018

In situ synchrotron X-ray diffraction of thin films under perturbation by an electric field

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In situ synchrotron X-ray diffraction of thin films under perturbation by an electric fieldOriginalChemical Uniformity in Ferroelectric KxNa1−xNbO3 Thin Films13Atomic layer deposition of functional multicomponent oxides71

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  1. Chemical Uniformity in Ferroelectric KxNa1−xNbO3 Thin Films

    Global Challenges · 2019-08-01

    Henrik Hovde Sønsteby, Ola Nilsen, Helmer Fjellvåg

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  2. Atomic layer deposition of functional multicomponent oxides

    APL Materials · 2019-11-01

    Mariona Coll, Mari Napari

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