RESEARCH PAPER · IEEE Transactions on Electron Devices · 2019
Toward Microwave S- and X-Parameter Approaches for the Characterization of Ferroelectrics for Applications in FeFETs and NCFETs
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Silicon · 2022-02-22
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Read original paper ↗ ·On the Existence of Negative Capacitance: Examining Ferroelectric-Dielectric Stack Experiments Using the NLS and LK Models
IEEE Transactions on Electron Devices · 2023-06-14
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Read original paper ↗ ·Unveiling the mechanism behind the negative capacitance effect in Hf0.5Zr0.5O2-Based ferroelectric gate stacks and introducing a Circuit-Compatible hybrid compact model for Leakage-Aware NCFETs
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