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RESEARCH PAPER · Journal of Advanced Dielectrics · 2018

Structural and electrical properties of ferroelectric BiFeO3/HfO2gate stack for nonvolatile memory applications

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Structural and electrical properties of ferroelectric BiFeO3/HfO2gate stack for nonvolatile memory applicationsOriginalDevelopment of highly reliable BiFeO3/HfO2/Silicon gate stacks for ferroelectric non-volatile memories in IoT applications3Binary perovskite solid solutions and trends in their phase transitions temperatures variation1Studies on electrical properties of PLD grown BiFeO3 - based layered MFIS heterostructure device0

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  1. Development of highly reliable BiFeO3/HfO2/Silicon gate stacks for ferroelectric non-volatile memories in IoT applications

    Journal of Materials Science Materials in Electronics · 2020-10-29

    Pramod Narayan Tripathi, Sanjeev Kumar Ojha, A. N. Nazarov

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  2. Binary perovskite solid solutions and trends in their phase transitions temperatures variation

    Journal of Advanced Dielectrics · 2021-09-08

    G. A. Geguzina, Inna G. Popova, Панич Анатолий Евгеньевич

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  3. Studies on electrical properties of PLD grown BiFeO3 - based layered MFIS heterostructure device

    Chemical Physics · 2025-07-07

    Akshay Panchasara, Urjitsinh I. Rathod, Sumana Hajra, Pruthaba Jadeja, Akshay Ranpariya, Savan Katba, Vanaraj Solanki, Mahesh N Jivani, Ashish Ravalia

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