RESEARCH PAPER · Physical review. B./Physical review. B · 2016
Coupling of bias-induced crystallographic shear planes with charged domain walls in ferroelectric oxide thin films
Myung‐Geun Han, Joseph A. Garlow, Matthieu Bugnet, Simon Divilov, Matthew S. J. Marshall, Lijun Wu, Matthew Dawber, Mariví Fernández-Serra, Gianluigi A. Botton, Sang‐Wook Cheong, F. J. Walker, Charles Ahn, Yimei Zhu
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