BetaCitation Atlas

RESEARCH PAPER · Analog Integrated Circuits and Signal Processing · 2016

Short critical area model and extraction algorithm based on defect characteristics in integrated circuits

Read original paper ↗

See where this research leads.

4 direct citing papers in this saved network. Explore the next layer with second-order citations.

Open in your workspace →Saved 2026-10-14 · complete coverage
Filter Citing Papers
Press Enter or comma to add · × to remove · searches titles and available abstracts
Journals
All journals
Most represented first · select one or more
Explore Terms In These PapersHide SuggestionsShow Suggestions

Original and current center papers stay visible as anchors.
Numbers show citations received
42 direct citing works

Short critical area model and extraction algorithm based on defect characteristics in integrated circuitsOriginalNovel Model of OCA in IC and Its Implementation on Hadoop0Real-Time Tiny Part Defect Detection System in Manufacturing Using Deep Learning145Application of mathematical morphology operation with memristor-based computation-in-memory architecture for detecting manufacturing defects10Industrial Surface Defect Detection Using Machine Leaning Approach0

Arrows point to the paper being cited. Selecting a paper shows its incoming citations and its known path back to the original paper.

Browse Matching Papers

Papers that cite this work

4 direct citing papers saved.

  1. Novel Model of OCA in IC and Its Implementation on Hadoop

    International Journal of Electronics and Electrical Engineering · 2019-01-01

    Shulei Wei, Junping Wang

    Read original paper ↗ ·
  2. Real-Time Tiny Part Defect Detection System in Manufacturing Using Deep Learning

    IEEE Access · 2019-01-01

    Jing Yang, Shaobo Li, Zheng Wang, Guanci Yang

    Read original paper ↗ ·
  3. Application of mathematical morphology operation with memristor-based computation-in-memory architecture for detecting manufacturing defects

    Fundamental Research · 2021-07-17

    Ying Zhou, Bin Gao, Qingtian Zhang, Peng Yao, Yiwen Geng, Xinyi Li, Wen Bang Sun, Meiran Zhao, Yue Xi, Jianshi Tang, He Qian, Huaqiang Wu

    Read original paper ↗ ·
  4. Industrial Surface Defect Detection Using Machine Leaning Approach

    International Conference on Information Systems and Computer Networks (ISCON) · 2025-09-05

    Aadi Poddar, Muskan Sureka, Rajdeep Chajtterjee, Mahendra Kumar Gourisaria, Sonal Jain, Diptendu Sinha Roy

    Read original paper ↗ ·