RESEARCH PAPER · e-Journal of Surface Science and Nanotechnology · 2011
Mesoscopic-Scale and Small Strain Field beneath SiO2/Si Interface Revealed by a Multiple-Wave X-ray Diffraction Phenomenon - Depth of the Strain Field
Read original paper ↗See where this research leads.
A citation map has not been saved for this paper yet.
Open in your workspace →Open your workspace to prepare the citation network.
The paper record is available below. Preparing a network uses the existing account and source-allowance controls.
Papers that cite this work
No saved citation network is available; this does not mean the paper has no citations.